JPH03114053U - - Google Patents
Info
- Publication number
- JPH03114053U JPH03114053U JP2215690U JP2215690U JPH03114053U JP H03114053 U JPH03114053 U JP H03114053U JP 2215690 U JP2215690 U JP 2215690U JP 2215690 U JP2215690 U JP 2215690U JP H03114053 U JPH03114053 U JP H03114053U
- Authority
- JP
- Japan
- Prior art keywords
- reference plane
- optical axis
- axis adjustment
- adjustment jig
- hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 4
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2215690U JP2515504Y2 (ja) | 1990-03-07 | 1990-03-07 | Ｘ線回折装置のゴニオメータ光軸調整治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2215690U JP2515504Y2 (ja) | 1990-03-07 | 1990-03-07 | Ｘ線回折装置のゴニオメータ光軸調整治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03114053U true JPH03114053U (en]) | 1991-11-22 |
| JP2515504Y2 JP2515504Y2 (ja) | 1996-10-30 |
Family
ID=31525175
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2215690U Expired - Lifetime JP2515504Y2 (ja) | 1990-03-07 | 1990-03-07 | Ｘ線回折装置のゴニオメータ光軸調整治具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2515504Y2 (en]) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010117368A (ja) * | 2010-02-18 | 2010-05-27 | Shimadzu Corp | Ｘ線回折装置及びｘ線調整方法 |
| JP2015222236A (ja) * | 2014-05-23 | 2015-12-10 | パルステック工業株式会社 | Ｘ線回折測定方法および入射角度調整用治具 |
| JP2017223539A (ja) * | 2016-06-15 | 2017-12-21 | 株式会社リガク | Ｘ線回折装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6270214B2 (ja) * | 2013-11-25 | 2018-01-31 | 株式会社リガク | Ｘ線分析装置の光軸調整方法及びｘ線分析装置 |
-
1990
- 1990-03-07 JP JP2215690U patent/JP2515504Y2/ja not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010117368A (ja) * | 2010-02-18 | 2010-05-27 | Shimadzu Corp | Ｘ線回折装置及びｘ線調整方法 |
| JP2015222236A (ja) * | 2014-05-23 | 2015-12-10 | パルステック工業株式会社 | Ｘ線回折測定方法および入射角度調整用治具 |
| JP2017223539A (ja) * | 2016-06-15 | 2017-12-21 | 株式会社リガク | Ｘ線回折装置 |
| US10585053B2 (en) | 2016-06-15 | 2020-03-10 | Rigaku Corporation | X-ray diffractometer |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2515504Y2 (ja) | 1996-10-30 |